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SN75155D

Specifications

SKU: 567609

BUY SN75155D https://www.utsource.net/itm/p/567609.html
Line Driver And Receiver 8-SOIC 0 to 70
Parameter Symbol Min Typ Max Unit Conditions
Supply Voltage VCC 4.75 5.0 5.25 V -
Output Current (Source) IOH - 6.0 - mA VCC = 5V, TA = 25°C
Output Current (Sink) IOL - 16 - mA VCC = 5V, TA = 25°C
Input High Voltage VIH 2.0 - 5.0 V -
Input Low Voltage VIL 0.8 - 2.0 V -
Propagation Delay Time tpd 10 22 34 ns VCC = 5V, TA = 25°C, VI = 2.0V to 3.0V, VO = 0.4V to 4.6V
Power Dissipation PD - - 350 mW -
Operating Temperature TA -40 - 85 °C -
Storage Temperature TSTG -65 - 150 °C -

Instructions for Use:

  1. Supply Voltage:

    • Ensure the supply voltage is within the specified range of 4.75V to 5.25V to avoid damage to the device.
  2. Output Current:

    • The device can source up to 6mA and sink up to 16mA per output. Do not exceed these limits to prevent overheating or damage.
  3. Input Voltage Levels:

    • For reliable operation, input voltages should be above 2.0V for a high logic level and below 0.8V for a low logic level.
  4. Propagation Delay:

    • The propagation delay time is critical for timing-sensitive applications. It ranges from 10ns to 34ns under typical conditions.
  5. Power Dissipation:

    • The maximum power dissipation is 350mW. Ensure proper heat sinking if operating near this limit to maintain device reliability.
  6. Operating Temperature:

    • The device is designed to operate between -40°C and 85°C. Avoid exceeding these temperature limits to prevent performance degradation or failure.
  7. Storage Temperature:

    • Store the device in an environment where the temperature does not fall below -65°C or rise above 150°C to ensure long-term reliability.
  8. Handling:

    • Handle the device with care to avoid static discharge, which can damage the internal circuits. Use appropriate ESD protection measures.
  9. Mounting:

    • When mounting the device on a PCB, ensure that all connections are secure and follow the recommended soldering profile to avoid thermal stress.
  10. Testing:

    • Before integrating the device into a larger system, perform initial testing to verify its functionality and ensure it meets the required specifications.
(For reference only)

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