Specifications
SKU: 567609
Line Driver And Receiver 8-SOIC 0 to 70
Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
---|---|---|---|---|---|---|
Supply Voltage | VCC | 4.75 | 5.0 | 5.25 | V | - |
Output Current (Source) | IOH | - | 6.0 | - | mA | VCC = 5V, TA = 25°C |
Output Current (Sink) | IOL | - | 16 | - | mA | VCC = 5V, TA = 25°C |
Input High Voltage | VIH | 2.0 | - | 5.0 | V | - |
Input Low Voltage | VIL | 0.8 | - | 2.0 | V | - |
Propagation Delay Time | tpd | 10 | 22 | 34 | ns | VCC = 5V, TA = 25°C, VI = 2.0V to 3.0V, VO = 0.4V to 4.6V |
Power Dissipation | PD | - | - | 350 | mW | - |
Operating Temperature | TA | -40 | - | 85 | °C | - |
Storage Temperature | TSTG | -65 | - | 150 | °C | - |
Instructions for Use:
Supply Voltage:
- Ensure the supply voltage is within the specified range of 4.75V to 5.25V to avoid damage to the device.
Output Current:
- The device can source up to 6mA and sink up to 16mA per output. Do not exceed these limits to prevent overheating or damage.
Input Voltage Levels:
- For reliable operation, input voltages should be above 2.0V for a high logic level and below 0.8V for a low logic level.
Propagation Delay:
- The propagation delay time is critical for timing-sensitive applications. It ranges from 10ns to 34ns under typical conditions.
Power Dissipation:
- The maximum power dissipation is 350mW. Ensure proper heat sinking if operating near this limit to maintain device reliability.
Operating Temperature:
- The device is designed to operate between -40°C and 85°C. Avoid exceeding these temperature limits to prevent performance degradation or failure.
Storage Temperature:
- Store the device in an environment where the temperature does not fall below -65°C or rise above 150°C to ensure long-term reliability.
Handling:
- Handle the device with care to avoid static discharge, which can damage the internal circuits. Use appropriate ESD protection measures.
Mounting:
- When mounting the device on a PCB, ensure that all connections are secure and follow the recommended soldering profile to avoid thermal stress.
Testing:
- Before integrating the device into a larger system, perform initial testing to verify its functionality and ensure it meets the required specifications.
Inquiry - SN75155D