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IRG4PC40FDPBF

Specifications

SKU: 838160

BUY IRG4PC40FDPBF https://www.utsource.net/itm/p/838160.html
INSULATED GATE BIPOLAR TRANSISTOR WITH ULTRAFAST SOFT RECOVERY DIODE
Parameter Symbol Min Typical Max Unit Notes
Drain-Source Voltage VDS - 400 - V Continuous
Gate-Source Voltage VGS -20 - 15 V Continuous
Continuous Drain Current ID - 6.7 - A @ TC = 25°C, VGS = 10V
Pulse Drain Current ID(p) - 13.4 - A @ TC = 25°C, VGS = 10V, tp = 10 μs, IG = 2A
Total Power Dissipation PTOT - - 98 W @ TC = 25°C
Junction Temperature TJ - - 150 °C Maximum
Storage Temperature TSTG -55 - 150 °C -
Thermal Resistance, Junction to Case RθJC - 0.85 - °C/W -

Instructions for Use:

  1. Handling Precautions:

    • ESD Protection: The IRG4PC40FDPBF is sensitive to electrostatic discharge (ESD). Use proper ESD protection equipment and follow ESD handling procedures.
    • Gate Protection: Avoid applying voltages outside the specified range to the gate. Exceeding the maximum gate-source voltage can cause permanent damage.
  2. Mounting:

    • Heat Sinking: Ensure adequate heat sinking to maintain the junction temperature within the specified limits. The thermal resistance (RθJC) should be considered when designing the heat sink.
    • Torque Specification: Follow the recommended torque specifications for mounting screws to avoid damaging the device.
  3. Operation:

    • Voltage and Current Ratings: Do not exceed the maximum drain-source voltage (VDS) or continuous drain current (ID). For pulse operation, ensure that the pulse duration and current do not exceed the specified values.
    • Gate Drive: Use a gate drive circuit that provides sufficient current to charge and discharge the gate capacitance quickly, ensuring fast switching times and minimizing switching losses.
  4. Storage:

    • Temperature Range: Store the device within the specified storage temperature range to prevent damage.
    • Humidity Control: Store the device in a dry environment to prevent moisture-related issues.
  5. Testing:

    • Initial Testing: Before integrating the device into a circuit, perform initial testing to verify its functionality and parameters.
    • Regular Inspection: Regularly inspect the device for signs of wear or damage, especially if it is used in harsh environments.
  6. Safety:

    • Overvoltage Protection: Implement overvoltage protection circuits to safeguard the device from transient voltages.
    • Overcurrent Protection: Use fuses or other overcurrent protection devices to prevent excessive current from damaging the device.

By following these guidelines, you can ensure the reliable and efficient operation of the IRG4PC40FDPBF MOSFET.

(For reference only)

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