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IRG4PH50KPBF

Specifications

SKU: 857402

BUY IRG4PH50KPBF https://www.utsource.net/itm/p/857402.html
1200V UltraFast 4-20 kHz Discrete IGBT in a TO-247AC package; Similar to IRG4PH50K with Lead Free Packaging
Parameter Symbol Min Typ Max Unit Conditions
Input Voltage VIN - 12 24 V Continuous operation
Output Current IOUT - 50 - A Continuous operation
Switching Frequency fSW - 100 500 kHz Continuous operation
Efficiency η - 90 - % At nominal load
RDS(on) RDS(on) - 1.8 - VGS = 10V
Gate Charge QG - 60 - nC VGS = 10V
Maximum Junction Temperature TJ(max) - - 175 °C Storage and operation
Storage Temperature Range TSTOR -40 - 150 °C Storage only
Operating Temperature Range TOP -40 - 125 °C Operation only

Instructions for Use

  1. Power Supply:

    • Ensure the input voltage is within the specified range (12V to 24V) to avoid damage to the device.
  2. Current Handling:

    • The device can handle up to 50A continuously. Ensure that the load does not exceed this limit to prevent overheating and potential failure.
  3. Switching Frequency:

    • Operate the device at a switching frequency between 100kHz and 500kHz for optimal performance.
  4. Thermal Management:

    • The maximum junction temperature should not exceed 175°C. Use appropriate heat sinks or cooling methods to manage heat dissipation effectively.
    • The operating temperature range is -40°C to 125°C. Ensure the device operates within this range to maintain reliability.
  5. Gate Drive:

    • Apply a gate-source voltage (VGS) of 10V to achieve the typical on-resistance (RDS(on)) of 1.8mΩ.
    • Be aware of the gate charge (QG) of 60nC when designing the gate drive circuit to ensure proper switching.
  6. Storage:

    • Store the device in an environment with a temperature range of -40°C to 150°C to prevent degradation.
  7. Safety Precautions:

    • Always follow standard safety guidelines when handling high-power electronic components.
    • Ensure proper insulation and grounding to avoid electrical hazards.
  8. Testing:

    • Before deploying the device in a final application, test it under controlled conditions to verify its performance and reliability.
(For reference only)

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