Specifications
SKU: 857402
1200V UltraFast 4-20 kHz Discrete IGBT in a TO-247AC package; Similar to IRG4PH50K with Lead Free Packaging
Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
---|---|---|---|---|---|---|
Input Voltage | VIN | - | 12 | 24 | V | Continuous operation |
Output Current | IOUT | - | 50 | - | A | Continuous operation |
Switching Frequency | fSW | - | 100 | 500 | kHz | Continuous operation |
Efficiency | η | - | 90 | - | % | At nominal load |
RDS(on) | RDS(on) | - | 1.8 | - | mΩ | VGS = 10V |
Gate Charge | QG | - | 60 | - | nC | VGS = 10V |
Maximum Junction Temperature | TJ(max) | - | - | 175 | °C | Storage and operation |
Storage Temperature Range | TSTOR | -40 | - | 150 | °C | Storage only |
Operating Temperature Range | TOP | -40 | - | 125 | °C | Operation only |
Instructions for Use
Power Supply:
- Ensure the input voltage is within the specified range (12V to 24V) to avoid damage to the device.
Current Handling:
- The device can handle up to 50A continuously. Ensure that the load does not exceed this limit to prevent overheating and potential failure.
Switching Frequency:
- Operate the device at a switching frequency between 100kHz and 500kHz for optimal performance.
Thermal Management:
- The maximum junction temperature should not exceed 175°C. Use appropriate heat sinks or cooling methods to manage heat dissipation effectively.
- The operating temperature range is -40°C to 125°C. Ensure the device operates within this range to maintain reliability.
Gate Drive:
- Apply a gate-source voltage (VGS) of 10V to achieve the typical on-resistance (RDS(on)) of 1.8mΩ.
- Be aware of the gate charge (QG) of 60nC when designing the gate drive circuit to ensure proper switching.
Storage:
- Store the device in an environment with a temperature range of -40°C to 150°C to prevent degradation.
Safety Precautions:
- Always follow standard safety guidelines when handling high-power electronic components.
- Ensure proper insulation and grounding to avoid electrical hazards.
Testing:
- Before deploying the device in a final application, test it under controlled conditions to verify its performance and reliability.
Inquiry - IRG4PH50KPBF