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IRF9540N

Specifications

SKU: 1380841

BUY IRF9540N https://www.utsource.net/itm/p/1380841.html
P-Channel HEXFET Power MOSFETP HEXFET MOS
Parameter Symbol Min Typical Max Unit Conditions
Drain-Source Voltage VDS - 100 - V
Gate-Source Voltage VGS -20 0 20 V
Continuous Drain Current ID - 8.0 - A TC = 25°C
Pulse Drain Current ID(p) - 28 - A tp = 10 ms, TC = 25°C
Power Dissipation PD - 76 - W TC = 25°C
Junction Temperature TJ - - 150 °C
Storage Temperature Range TSTG -65 - 150 °C
Thermal Resistance, Junction to Case RθJC - 1.0 - °C/W
Total Gate Charge QG - 130 - nC
Input Capacitance Ciss - 2400 - pF VDS = 25V, f = 1 MHz
Output Capacitance Coss - 220 - pF VDS = 25V, f = 1 MHz
Reverse Transfer Capacitance Crss - 150 - pF VDS = 25V, f = 1 MHz

Instructions for Use:

  1. Handling Precautions:

    • Handle the IRF9540N with care to avoid static damage.
    • Ensure proper grounding when handling the device.
  2. Mounting:

    • Mount the device on a heatsink if operating at high power levels to maintain junction temperature within safe limits.
    • Use thermal compound between the device and heatsink to improve heat transfer.
  3. Biasing:

    • Apply a gate-source voltage (VGS) within the specified range to control the drain current.
    • For optimal performance, keep VGS between 4V and 10V for full enhancement.
  4. Operation:

    • Ensure that the drain-source voltage (VDS) does not exceed the maximum rating of 100V.
    • Limit the continuous drain current (ID) to 8A at room temperature (25°C).
  5. Pulsed Operation:

    • For pulsed applications, the peak drain current (ID(p)) can be up to 28A with a pulse width of 10 ms.
    • Ensure that the duty cycle is low enough to prevent overheating.
  6. Thermal Management:

    • Monitor the junction temperature (TJ) to ensure it does not exceed 150°C.
    • Use appropriate cooling methods to manage heat dissipation.
  7. Storage:

    • Store the device in a dry, cool environment within the storage temperature range of -65°C to 150°C.
  8. Testing:

    • Test the device under controlled conditions to verify its performance parameters.
    • Use appropriate test equipment and procedures to avoid damaging the device.
(For reference only)

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