Specifications
SKU: 1380841
P-Channel HEXFET Power MOSFETP HEXFET MOS
Parameter | Symbol | Min | Typical | Max | Unit | Conditions |
---|---|---|---|---|---|---|
Drain-Source Voltage | VDS | - | 100 | - | V | |
Gate-Source Voltage | VGS | -20 | 0 | 20 | V | |
Continuous Drain Current | ID | - | 8.0 | - | A | TC = 25°C |
Pulse Drain Current | ID(p) | - | 28 | - | A | tp = 10 ms, TC = 25°C |
Power Dissipation | PD | - | 76 | - | W | TC = 25°C |
Junction Temperature | TJ | - | - | 150 | °C | |
Storage Temperature Range | TSTG | -65 | - | 150 | °C | |
Thermal Resistance, Junction to Case | RθJC | - | 1.0 | - | °C/W | |
Total Gate Charge | QG | - | 130 | - | nC | |
Input Capacitance | Ciss | - | 2400 | - | pF | VDS = 25V, f = 1 MHz |
Output Capacitance | Coss | - | 220 | - | pF | VDS = 25V, f = 1 MHz |
Reverse Transfer Capacitance | Crss | - | 150 | - | pF | VDS = 25V, f = 1 MHz |
Instructions for Use:
Handling Precautions:
- Handle the IRF9540N with care to avoid static damage.
- Ensure proper grounding when handling the device.
Mounting:
- Mount the device on a heatsink if operating at high power levels to maintain junction temperature within safe limits.
- Use thermal compound between the device and heatsink to improve heat transfer.
Biasing:
- Apply a gate-source voltage (VGS) within the specified range to control the drain current.
- For optimal performance, keep VGS between 4V and 10V for full enhancement.
Operation:
- Ensure that the drain-source voltage (VDS) does not exceed the maximum rating of 100V.
- Limit the continuous drain current (ID) to 8A at room temperature (25°C).
Pulsed Operation:
- For pulsed applications, the peak drain current (ID(p)) can be up to 28A with a pulse width of 10 ms.
- Ensure that the duty cycle is low enough to prevent overheating.
Thermal Management:
- Monitor the junction temperature (TJ) to ensure it does not exceed 150°C.
- Use appropriate cooling methods to manage heat dissipation.
Storage:
- Store the device in a dry, cool environment within the storage temperature range of -65°C to 150°C.
Testing:
- Test the device under controlled conditions to verify its performance parameters.
- Use appropriate test equipment and procedures to avoid damaging the device.
Inquiry - IRF9540N