Specifications
SKU: 4050745
TRANSISTOR 3 mA, 50 V, P-CHANNEL, Si, SMALL SIGNAL, JFET, TO-92, 2-5F1C, SC-43, 3 PIN, FET General Purpose Small Signal
Parameter | Symbol | Min | Typical | Max | Unit | Conditions |
---|---|---|---|---|---|---|
Collector-Emitter Voltage | Vceo | - | - | 450 | V | IC = 0, Tc = 25°C |
Emitter-Collector Voltage | Veco | - | - | 450 | V | IB = 0, Tc = 25°C |
Collector-Base Voltage | Vcbo | - | - | 600 | V | IE = 0, Tc = 25°C |
Base-Emitter Voltage | Vbe(on) | - | 2.0 | 3.0 | V | IC = 1A, IB = 100mA, Tc = 25°C |
Collector Current | Ic | - | - | 15 | A | Vce = 450V, Tc = 25°C |
Base Current | Ib | - | - | 1.5 | A | Vce = 450V, IC = 15A, Tc = 25°C |
Power Dissipation | Ptot | - | - | 180 | W | Tc = 25°C |
Storage Temperature Range | Tstg | -55 | - | 150 | °C | - |
Operating Junction Temperature | Tj | -55 | - | 150 | °C | - |
Instructions for Use:
Mounting and Handling:
- Ensure that the device is handled with care to avoid mechanical stress.
- Mount the device on a heatsink to ensure proper heat dissipation, especially when operating at high power levels.
Electrical Connections:
- Connect the collector (C), base (B), and emitter (E) terminals correctly.
- Use appropriate wire gauges to handle the current ratings.
Thermal Management:
- Ensure that the junction temperature (Tj) does not exceed 150°C.
- Use thermal paste between the device and the heatsink for better thermal conductivity.
Biasing:
- Ensure that the base-emitter voltage (Vbe) is within the specified range to avoid damage.
- Use a suitable biasing circuit to maintain stable operation.
Overvoltage Protection:
- Protect the device from overvoltage conditions by using appropriate clamping diodes or other protective circuits.
Storage:
- Store the device in a dry and cool place to prevent moisture damage.
- Avoid exposure to extreme temperatures outside the storage temperature range (-55°C to 150°C).
Testing:
- Test the device under controlled conditions to ensure it meets the specified parameters.
- Use a suitable test setup to avoid damaging the device during testing.
Compliance:
- Ensure that the device is used in compliance with all relevant safety and regulatory standards.
Inquiry - 2SJ103-Y