Name: FMH23N50E 23N50E
Availability: InStock

FMH23N50E 23N50E

Category: Transistors, Bipolar transistors

Specifications

SKU: 9380136

BUY FMH23N50E 23N50E https://www.utsource.net/itm/p/9380136.html

Parameter	Symbol	Min	Typ	Max	Unit	Conditions
Drain-Source Voltage	V_DS	-	500	-	V
Gate-Source Voltage	V_GS	-15	0	20	V
Continuous Drain Current	I_D	-	23	-	A	T_C = 25°C
Pulse Drain Current	I_Dpeak	-	69	-	A	t_p = 10 μs, T_C = 25°C
Power Dissipation	P_TOT	-	230	-	W	T_C = 25°C
Junction Temperature	T_J	-	-	175	°C
Storage Temperature Range	T_STG	-65	-	150	°C
Thermal Resistance, Junction to Case	R_θJC	-	0.45	-	°C/W
Total Gate Charge	Q_G	-	130	-	nC	V_GS = 15V, I_D = 23A
Input Capacitance	C_iss	-	1800	-	pF	V_DS = 25V, f = 1 MHz
Output Capacitance	C_oss	-	230	-	pF	V_DS = 25V, f = 1 MHz
Reverse Transfer Capacitance	C_rss	-	100	-	pF	V_DS = 25V, f = 1 MHz
Turn-On Delay Time	t_don	-	110	-	ns	V_GS = 15V, I_D = 23A
Rise Time	t_r	-	60	-	ns	V_GS = 15V, I_D = 23A
Turn-Off Delay Time	t_do	-	110	-	ns	V_GS = 15V, I_D = 23A
Fall Time	t_f	-	60	-	ns	V_GS = 15V, I_D = 23A

Handling and Storage:
- Store in a dry, cool place away from direct sunlight.
- Handle with care to avoid mechanical damage and static discharge.
Mounting:
- Ensure proper heat sinking to maintain the junction temperature within the specified range.
- Use thermal grease between the device and the heatsink for better thermal conductivity.
Biasing:
- Apply the gate-source voltage (V_GS) carefully to avoid exceeding the maximum ratings.
- Ensure the gate is properly decoupled to prevent oscillations.
Operation:
- Operate within the continuous drain current (I_D) and pulse drain current (I_Dpeak) limits.
- Monitor the power dissipation (P_TOT) to avoid overheating.
Testing:
- Use appropriate test equipment and methods to ensure accurate measurements.
- Follow safety guidelines to prevent damage to the device and test equipment.
Soldering:
- Use a controlled soldering process to avoid excessive temperatures that could damage the device.
- Allow the device to cool down before handling or testing.

(For reference only)

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