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IRGP4063D

Specifications

SKU: 11233209

BUY IRGP4063D https://www.utsource.net/itm/p/11233209.html

Parameter Symbol Test Conditions Min Typical Max Unit
Collector-Emitter Voltage VCEO IC = 0, IC = 0 - 550 - V
Collector-Base Voltage VCBO IE = 0, IC = 0 - 600 - V
Emitter-Base Voltage VEBO IC = 0, IE = 100 μA - 5 - V
Continuous Collector Current IC TC = 25°C - 30 - A
Continuous Collector Current IC TC = 100°C - 18 - A
Continuous Emitter Current IE TC = 25°C - 30 - A
Continuous Emitter Current IE TC = 100°C - 18 - A
Total Device Dissipation PTOT TC = 25°C - 360 - W
Total Device Dissipation PTOT TC = 100°C - 220 - W
Junction Temperature TJ - - 150 - °C
Storage Temperature Range TSTG - -55 - 150 °C
Forward Transconductance gfs VCE = 10 V, IC = 10 A 30 - 60 S
Base-Emitter Saturation Voltage VBE(sat) IC = 10 A, IB = 1 A 1.2 - 1.8 V
Collector-Emitter Saturation Voltage VCE(sat) IC = 10 A, IB = 1 A 1.2 - 1.8 V
Turn-On Delay Time td(on) VGE = 15 V, IC = 10 A - 50 - ns
Rise Time tr VGE = 15 V, IC = 10 A - 50 - ns
Turn-Off Delay Time td(off) VGE = 0 V, IC = 10 A - 75 - ns
Fall Time tf VGE = 0 V, IC = 10 A - 75 - ns

Instructions for Use:

  1. Handling Precautions:

    • Handle the device with care to avoid mechanical damage.
    • Use proper ESD (Electrostatic Discharge) protection measures to prevent damage from static electricity.
  2. Mounting:

    • Ensure proper thermal management by using heat sinks or other cooling methods to keep the junction temperature within the specified limits.
    • Follow the recommended PCB layout guidelines to minimize parasitic inductances and capacitances.
  3. Biasing:

    • Ensure that the base-emitter voltage (VBE) is within the specified range to avoid damaging the device.
    • Use appropriate gate drive circuits to provide the necessary current for turn-on and turn-off operations.
  4. Operating Conditions:

    • Do not exceed the maximum ratings for collector-emitter voltage (VCEO), collector-base voltage (VCBO), and emitter-base voltage (VEBO).
    • Keep the collector current (IC) and total device dissipation (PTOT) within the specified limits to ensure reliable operation.
  5. Testing:

    • Use the test conditions provided in the parameter table for accurate measurements.
    • Perform regular testing to monitor the performance and health of the device.
  6. Storage:

    • Store the device in a dry, cool environment to prevent moisture damage.
    • Follow the storage temperature range (TSTG) to ensure long-term reliability.
(For reference only)

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