Specifications
SKU: 11241325
Parameter | Symbol | Min | Typ | Max | Unit |
---|---|---|---|---|---|
Collector-Emitter Voltage | V CES | - | - | 1000 | V |
Gate-Emitter Voltage | V GES | -20 | - | 20 | V |
Continuous Collector Current | I C | - | 60 | - | A |
Pulse Collector Current | I CM | - | 180 | - | A (10ms) |
Power Dissipation | P T | - | - | 300 | W |
Junction Temperature | T J | -55 | - | 175 | °C |
Storage Temperature | T STG | -55 | - | 150 | °C |
Thermal Resistance | R THJC | - | 0.5 | - | K/W |
Instructions for Use:
Mounting:
- Ensure proper heat sinking to maintain junction temperature within specified limits.
- Use a thermal interface material (TIM) between the IGBT and the heatsink for optimal thermal performance.
Biasing:
- Apply gate-emitter voltage (V GE) within the specified range to avoid damage.
- Use a gate resistor to limit current and prevent oscillations.
Current Handling:
- Do not exceed the continuous collector current (I C) rating.
- For pulse applications, ensure the pulse duration does not exceed the specified limit (10ms).
Temperature Management:
- Monitor the junction temperature (T J) to prevent overheating.
- Store the device within the storage temperature range (T STG) to avoid damage.
Handling:
- Handle with care to avoid mechanical stress.
- Use appropriate ESD protection to prevent damage from static electricity.
Testing:
- Perform initial testing at low power levels to ensure correct operation.
- Regularly inspect the device for signs of wear or damage.
Soldering:
- Use a controlled soldering process to avoid exceeding the maximum junction temperature.
- Allow sufficient time for cooling after soldering to prevent thermal shock.
Inquiry - 60N100 FGL60N100BNTD IGBT NEW ORIGINAL