Specifications
SKU: 11244401
Parameter | Symbol | Min | Typical | Max | Unit | Condition |
---|---|---|---|---|---|---|
Drain-Source Voltage | VDS | - | 500 | - | V | |
Gate-Source Voltage | VGS | -20 | - | 20 | V | |
Continuous Drain Current | ID | - | 24 | - | A | TC = 25°C |
Pulse Drain Current | ID(p) | - | 80 | - | A | tp = 10 μs, IG = 10 A |
Power Dissipation | PTOT | - | 360 | - | W | TC = 25°C |
Junction Temperature | TJ | - | - | 175 | °C | |
Storage Temperature Range | TSTG | -65 | - | 150 | °C | |
Thermal Resistance, Junction to Case | RθJC | - | 0.5 | - | °C/W |
Instructions for Use:
Mounting:
- Ensure proper heat sinking to maintain junction temperature within safe limits.
- Use recommended mounting torque (typically 2.5 Nm) to avoid damage.
Biasing:
- Apply gate-source voltage (VGS) within the specified range (-20V to +20V).
- Ensure gate drive circuitry is designed to provide sufficient current to switch the device quickly.
Current Handling:
- Do not exceed the continuous drain current (ID) of 24A at 25°C case temperature.
- For pulse applications, ensure the pulse duration (tp) does not exceed 10 μs and the peak current (ID(p)) does not exceed 80A.
Thermal Management:
- Monitor the junction temperature (TJ) to ensure it does not exceed 175°C.
- Use thermal paste or thermal interface materials between the device and heat sink to improve thermal conductivity.
Storage:
- Store the device in a dry environment within the temperature range of -65°C to 150°C.
- Avoid exposure to high humidity and corrosive environments.
Handling:
- Handle with care to avoid mechanical stress on the leads and body.
- Use appropriate ESD protection to prevent damage from static electricity.
Testing:
- Perform initial testing under controlled conditions to verify proper operation.
- Refer to the datasheet for detailed test procedures and recommended test circuits.
Inquiry - IRFP4110PBF IRFP4110