Specifications
SKU: 11244471
Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
---|---|---|---|---|---|---|
Collector-Emitter Voltage | VCE | - | - | 600 | V | |
Gate-Source Voltage | VGS | -15 | - | 20 | V | |
Continuous Collector Current | IC | - | 75 | - | A | TC = 25°C |
Continuous Collector Current | IC | - | 55 | - | A | TC = 100°C |
Power Dissipation | PTOT | - | - | 280 | W | TC = 25°C |
Junction Temperature | TJ | - | - | 175 | °C | |
Storage Temperature Range | TSTG | -55 | - | 150 | °C | |
Total Gate Charge | QG | - | 210 | - | nC | VGE = ±15V, IC = 75A |
Input Capacitance | Ciss | - | 3600 | - | pF | f = 1 MHz |
Output Capacitance | Coss | - | 340 | - | pF | f = 1 MHz |
Reverse Transfer Capacitance | Crss | - | 250 | - | pF | f = 1 MHz |
Instructions for Use:
Handling Precautions:
- Avoid exceeding the maximum ratings specified in the table to prevent damage to the device.
- Use appropriate heat sinks to manage the power dissipation and keep the junction temperature within safe limits.
Mounting:
- Ensure proper mounting to a heatsink to dissipate heat effectively. The thermal resistance (Rth(j-c)) should be considered in the design.
- Follow the recommended torque values for screw terminals to avoid mechanical stress.
Gate Drive:
- Apply a gate-source voltage (VGS) within the specified range to ensure reliable switching.
- Use a gate resistor to control the rise and fall times of the gate signal, which can help reduce switching losses and electromagnetic interference (EMI).
Thermal Management:
- Monitor the junction temperature (TJ) to ensure it does not exceed 175°C.
- Consider using forced air cooling or other cooling methods if natural convection is insufficient.
Storage:
- Store the device in a dry environment within the storage temperature range (-55°C to 150°C) to prevent moisture-related issues.
Testing:
- Before integrating the device into a circuit, perform initial tests to verify its functionality and parameters.
- Use appropriate test equipment and procedures to avoid damaging the device during testing.
Inquiry - IKW75N60H3