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IRFZ44NPBF IRFZ44N

Specifications

SKU: 11264276

BUY IRFZ44NPBF IRFZ44N https://www.utsource.net/itm/p/11264276.html

Parameter Symbol Min Typical Max Unit Conditions
Drain-Source Voltage VDS - - 55 V
Gate-Source Voltage VGS -20 - 20 V
Continuous Drain Current ID - - 49 A TC = 25°C
Continuous Drain Current ID - - 31 A TC = 100°C
Pulse Drain Current IDpeak - - 200 A tp = 10μs, IG = 11A
Power Dissipation PD - - 185 W TC = 25°C
Junction Temperature TJ - - 150 °C
Storage Temperature TSTG -55 - 150 °C
Thermal Resistance (Junction to Case) RθJC - 0.47 - °C/W
Input Capacitance Ciss - 1640 - pF VDS = 25V, f = 1MHz
Output Capacitance Coss - 670 - pF VDS = 25V, f = 1MHz
Reverse Transfer Capacitance Crss - 350 - pF VDS = 25V, f = 1MHz
Gate Charge QG - 68 - nC VGS = 10V
Total Gate Charge QGT - 76 - nC VGS = 10V
Turn-On Delay Time td(on) - 17 - ns ID = 31A, VGS = 10V, RG = 2Ω
Rise Time tr - 33 - ns ID = 31A, VGS = 10V, RG = 2Ω
Turn-Off Delay Time td(off) - 17 - ns ID = 31A, VGS = 10V, RG = 2Ω
Fall Time tf - 46 - ns ID = 31A, VGS = 10V, RG = 2Ω
On-State Resistance RDS(on) - 0.018 0.024 Ω VGS = 10V, ID = 25A, TJ = 25°C
On-State Resistance RDS(on) - 0.028 0.035 Ω VGS = 10V, ID = 25A, TJ = 125°C

Instructions for Use:

  1. Mounting and Heat Sinking:

    • Ensure proper heat sinking to maintain the junction temperature within safe limits.
    • Use a thermal compound between the MOSFET and the heatsink to improve thermal conductivity.
  2. Gate Drive:

    • Apply a gate voltage of at least 10V to ensure the MOSFET is fully on and minimize on-state resistance.
    • Use a gate resistor to control the switching speed and reduce electromagnetic interference (EMI).
  3. Overcurrent Protection:

    • Implement overcurrent protection to prevent damage from excessive current.
    • Consider using a current-limiting resistor or a fuse in series with the drain.
  4. Storage and Handling:

    • Store the MOSFET in a dry environment to prevent moisture damage.
    • Handle the MOSFET with care to avoid static discharge, which can damage the gate oxide.
  5. PCB Layout:

    • Keep the gate traces short and direct to minimize parasitic inductance.
    • Use wide traces for the drain and source to handle high currents efficiently.
  6. Testing:

    • Test the MOSFET in a controlled environment to ensure it meets the specified parameters.
    • Verify the gate-source and drain-source voltages to ensure they are within the rated limits.
  7. Derating:

    • Derate the continuous drain current and power dissipation at higher temperatures to ensure reliable operation.
  8. Pulse Operation:

    • For pulse applications, ensure that the pulse width and frequency do not exceed the maximum ratings.
    • Check the thermal performance under pulse conditions to avoid overheating.
(For reference only)

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