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PESD5V0L2BT

Specifications

SKU: 11301416

BUY PESD5V0L2BT https://www.utsource.net/itm/p/11301416.html

Parameter Symbol Min Typ Max Unit Conditions
Operating Voltage Vop 3.6 - 5.5 V -
Reverse Standoff Voltage Vrwm - - 5.0 V -
Maximum Clamping Voltage Vc - 8.1 - V @1 A
Peak Pulse Current Ipp - - 25 A 10/1000 μs pulse
Reverse Leakage Current Irr - 0.1 1 μA @5.0 V
Capacitance C - 20 - pF @1 MHz
Response Time tr - 1 - ns -
Operating Temperature Topr -40 - 85 °C -
Storage Temperature Tstg -65 - 150 °C -

Instructions for Use:

  1. Voltage Handling:

    • Ensure that the operating voltage does not exceed the maximum reverse standoff voltage (5.0 V) to prevent damage.
    • The device is designed to operate within the range of 3.6 V to 5.5 V.
  2. Current Handling:

    • The peak pulse current should not exceed 25 A for pulses of 10/1000 μs duration.
    • Continuous current handling should be kept well below this value to avoid overheating and potential failure.
  3. Leakage Current:

    • The reverse leakage current at 5.0 V should not exceed 1 μA, with a typical value of 0.1 μA.
  4. Capacitance:

    • The capacitance of the device is typically 20 pF at 1 MHz, which can affect high-frequency applications.
  5. Response Time:

    • The device has a fast response time of 1 ns, making it suitable for protecting sensitive circuits from transient voltages.
  6. Temperature Range:

    • The operating temperature range is -40°C to 85°C, and the storage temperature range is -65°C to 150°C. Ensure that the device is not exposed to temperatures outside these ranges for extended periods.
  7. Mounting:

    • Use appropriate soldering techniques to ensure good thermal and electrical connections.
    • Avoid excessive mechanical stress on the leads during assembly.
  8. Storage:

    • Store the device in a dry, cool place to prevent moisture-related issues.
  9. Handling:

    • Handle the device with care to avoid static discharge, which can damage the component.
    • Use ESD-safe tools and workstations when handling the device.
  10. Testing:

    • Test the device using the specified conditions to ensure it meets the required performance parameters.
(For reference only)

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