Specifications
SKU: 11759513
Parameter | Description | Value |
---|---|---|
Device Type | 256K x 16-Bit CMOS Static RAM | |
Package Type | 44-Pin Plastic Quad Flat Pack (PQFP) | |
Operating Voltage (Vcc) | Supply Voltage Range | 4.5V to 5.5V |
Access Time (tAC) | Access Time at Vcc = 5V, TA = 25°C | 15 ns |
Cycle Time (tCYC) | Minimum Cycle Time | 15 ns |
Data Retention Time | Data Retention Time at Vcc = 4.5V, TA = 85°C | 10 years |
Standby Current (Icc) | Standby Current at Vcc = 5V, TA = 25°C | 5 μA |
Active Current (Icc) | Active Current at Vcc = 5V, TA = 25°C | 120 mA |
Temperature Range (TA) | Operating Temperature Range | -40°C to +85°C |
Storage Temperature | Storage Temperature Range | -65°C to +150°C |
Pin Configuration | Pin Count | 44 |
Pin Functions | - A0-A17: Address Inputs | |
- DQ0-DQ15: Data I/O | ||
- CE: Chip Enable (Low Active) | ||
- OE: Output Enable (Low Active) | ||
- WE: Write Enable (Low Active) | ||
- Vcc: Power Supply | ||
- GND: Ground |
Instructions for Use:
Power Supply:
- Connect Vcc to a stable 5V power supply.
- Ensure the ground (GND) is properly connected to avoid noise and data corruption.
Addressing:
- Apply the desired address to the address lines (A0-A17) to select the memory location.
- The device supports 256K addresses, each with 16 bits of data.
Data I/O:
- Data is read from or written to the data lines (DQ0-DQ15).
- For read operations, set the Output Enable (OE) low while the Chip Enable (CE) is low.
- For write operations, set the Write Enable (WE) low while the Chip Enable (CE) is low.
Control Signals:
- Chip Enable (CE): Low to enable the device; high to disable.
- Output Enable (OE): Low to enable data output; high to tristate the data lines.
- Write Enable (WE): Low to write data; high to prevent writing.
Timing:
- Ensure that the access time (tAC) and cycle time (tCYC) are respected to avoid data corruption.
- Use appropriate timing circuits or microcontroller settings to meet these requirements.
Environmental Conditions:
- Operate the device within the specified temperature range to ensure reliable performance.
- Store the device in a dry environment to prevent damage.
Handling:
- Handle the device with care to avoid static discharge, which can damage the internal circuitry.
- Use proper ESD (Electrostatic Discharge) protection when handling the device.
Testing:
- Perform initial testing under controlled conditions to verify the functionality of the device.
- Use standard test patterns to validate read and write operations.
Inquiry - TMS4464-15NL