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Specifications
SKU: 12394493
| Parameter | Description | Value |
|---|---|---|
| Part Number | GB98TDN | - |
| Type | N-Channel MOSFET | - |
| VDS (Max) | Drain-to-Source Voltage | 60V |
| VGS (Max) | Gate-to-Source Voltage | ±20V |
| ID (Max) | Continuous Drain Current | 10A |
| Ptot (Max) | Total Power Dissipation (Tc = 25°C) | 100W |
| RDS(on) | On-State Resistance (VGS = 10V) | 0.015Ω |
| fT | Transition Frequency | 350MHz |
| QG | Gate Charge | 50nC |
| QGD | Gate-to-Drain Charge | 15nC |
| QGS | Gate-to-Source Charge | 10nC |
| td(on) | Turn-On Delay Time | 15ns |
| tr | Rise Time | 10ns |
| td(off) | Turn-Off Delay Time | 20ns |
| tf | Fall Time | 15ns |
| θJA | Junction-to-Ambient Thermal Resistance | 62.5°C/W |
| θJC | Junction-to-Case Thermal Resistance | 3.5°C/W |
| Operating Temperature Range | Junction Temperature (TJ) | -55°C to +175°C |
| Storage Temperature Range | Storage Temperature (TSTG) | -65°C to +150°C |
Instructions for Use:
Handling Precautions:
- Handle the device with care to avoid damage to the leads or the body.
- Use proper ESD (Electrostatic Discharge) protection when handling the device.
Mounting:
- Ensure that the mounting surface is flat and clean to ensure good thermal contact.
- Apply a suitable thermal compound between the device and the heatsink to improve heat dissipation.
Biasing:
- Ensure that the gate-to-source voltage (VGS) is within the specified limits to prevent damage.
- Use appropriate gate drive circuits to ensure fast and reliable switching.
Power Dissipation:
- Calculate the power dissipation based on the load current and RDS(on) to ensure the device operates within safe limits.
- Use a heatsink if necessary to keep the junction temperature within the operating range.
Switching Applications:
- For high-frequency switching applications, minimize parasitic inductances and capacitances in the circuit layout.
- Ensure that the gate drive circuit can provide sufficient current to charge and discharge the gate quickly.
Storage:
- Store the device in a dry, cool place away from direct sunlight and sources of heat.
- Follow the storage temperature range to prevent degradation of the device.
Testing:
- Use appropriate test equipment and methods to verify the device parameters.
- Do not exceed the maximum ratings during testing to avoid damaging the device.
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